Greenberg, Joel <br/><br/>
X-ray diffraction imaging :  technology and applications / 
Joel Greenberg and Krzysztof Iniewski. 
 - pages cm. 
 - Taylor and Francis series in devices, circuits, & systems .
<br/><br/>Includes bibliographical references. 
<br/><br/><label>ISBN: </label>9781498783613 (hardback : alk. paper) 
<br/><br/><label>LCCN: </label>2018027858 
<br/><br/><label>Subjects--Topical Terms: </label><br/>X-ray diffraction imaging.<br/>Radiography, Industrial.<br/>Detectors--Equipment and supplies.<br/>Refractometers.
<br/><br/><label>LC Class. No.: </label>TA417.25  / .G74 2018 
<br/><br/><label>Dewey Class. No.: </label>620.1/1272